DS EN 60749-27:2006现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 27: Electrostatic Discharge (Esd) Sensitivity Testing - Machine Model (Mm)
出版：Danish Standards
专家解读视频
基本信息
标准编号： DS EN 60749-27:2006
发布时间：2013/1/25 0:00:00
标准类别：Standard
出版单位：Danish Standards
标准页数：32
标准简介
Describes a procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
等同采用的国际标准
EN 60749-27:2006 - Identical
