DIN EN 60749-18 : 2018现行
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 47/2468/CDV:2018); German and English version prEN 60749-18:2018
出版：German Institute for Standardisation (Deutsches Institut für Normung)
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基本信息
标准编号： DIN EN 60749-18 : 2018
标准类别：Draft
出版单位：German Institute for Standardisation (Deutsches Institut für Normung)
标准页数：0
标准简介
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
本标准替代的旧标准
