EIA JESD 22 A108:2005被替代
Temperature, Bias, And Operating Life
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 22 A108:2005
发布时间：2005/6/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：14
标准简介
Determines the effects of bias conditions and temperature, over time, on solid state devices is now available. Includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for high temperature stress, and a procedure to follow if parts are not tested within the allowed time window.
标准备注
Supersedes EIA JESD 22 (07/2004)
本标准替代的旧标准
替代本标准的新标准
