EIA JESD 22 A108:2010被替代
Temperature, Bias, And Operating Life
出版：JEDEC Solid State Technology Association
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基本信息
标准编号： EIA JESD 22 A108:2010
发布时间：2010/11/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：14
标准简介
Ascertains the effects of bias conditions and temperature on solid state devices over time. Simulates the devices' operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring.
标准备注
Supersedes EIA JESD 22 (07/2004)
本标准替代的旧标准
替代本标准的新标准
