EIA JESD 78:2011被替代
Ic Latch-Up Test
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 78:2011
发布时间：2011/11/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：30
标准简介
Specifies the I-test and the overvoltage latch-up testing of integrated circuits. Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are extremely important in determining product reliability and minimizing No Trouble Found (NTF) and Electrical Overstress (EOS) failures due to latch-up. Applies to NMOS, CMOS, bipolar, and all variations and combinations of these technologies.
标准备注
Supersedes EIA JESD 17 (06/2001)
本标准替代的旧标准
替代本标准的新标准
