PREN 15991:2009被替代
Testing Of Ceramic And Basic Materials - Direct Determination Of Mass Fractions Of Impurities In Powders And Granules Of Non-oxidic Ceramic Raw And Basic Materials By Inductively Coupled Plasma Optical Emission Spectroscopy (icp Oes) With Electrothermal Vaporisation (etv)
出版：Comite Europeen de Normalisation
专家解读视频
Describes a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
09/30187541 DC - Identical
DIN EN 15991 (2009-09) - Identical
NF EN 15991:2009 - Identical
NEN EN 15991:2009 - Identical
