NEN EN 15991:2009被替代
Testing Of Ceramic And Basic Materials - Direct Determination Of Mass Fractions Of Impurities In Powders And Granules Of Non-oxidic Ceramic Raw And Basic Materials By Inductively Coupled Plasma Optical Emission Spectroscopy (icp Oes) With Electrothermal Vaporisation (etv)
出版：Nederlands Normalisatie Instituut
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基本信息
标准编号： NEN EN 15991:2009
发布时间：2009/10/1 0:00:00
标准类别：Draft
出版单位：Nederlands Normalisatie Instituut
标准页数：28
标准简介
Specifies a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
替代本标准的新标准
等同采用的国际标准
PREN 15991:2009 - Identical
