CEI EN 60749-5 : 2005现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
出版：Comitato Elettrotecnico Italiano
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基本信息
标准编号： CEI EN 60749-5 : 2005
发布时间：2005/1/1 0:00:00
标准类别：Standard
出版单位：Comitato Elettrotecnico Italiano
标准页数：14
标准简介
Specifies a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
本标准替代的旧标准
