ASTM F744-92 (Invalid Record)被替代
Method For Measuring Dose Rate Threshold For Upset Of Digital Integrated Circuits
出版：American Society for Testing and Materials
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基本信息
标准编号： ASTM F744-92 (Invalid Record)
标准类别：Standard
出版单位：American Society for Testing and Materials
标准页数：0
标准简介
CONTAINED IN VOL 10.04 Covers measurement of threshold level of radiation dose rate that causes upset in digital integrated circuits under static operating conditions. Radiation source is a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
替代本标准的新标准
