
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
出版:American Society for Testing and Materials

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基本信息
标准编号: ASTM F744M-97(2003)
发布时间:1997/2/10 0:00:00
标准类别:Standard
出版单位:American Society for Testing and Materials
标准页数:6
标准简介
CONTAINED IN VOL. 10.04, 2006Describes the measurement of the threshold level of radiation dose rate that upsets digital integrated circuits during static operating conditions.
标准备注
Supersedes ASTM F 744.
(03/2002)
替代本标准的新标准