CEI EN 60749-24 : 2012现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
出版：Comitato Elettrotecnico Italiano
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基本信息
标准编号： CEI EN 60749-24 : 2012
发布时间：2012/1/1 0:00:00
标准类别：Standard
出版单位：Comitato Elettrotecnico Italiano
标准页数：18
标准简介
Defines accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
本标准替代的旧标准
