CEI EN 60749-4 Ed. 2 (2017)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (Hast)
出版：Comitato Elettrotecnico Italiano
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基本信息
标准编号： CEI EN 60749-4 Ed. 2 (2017)
标准类别：Standard
出版单位：Comitato Elettrotecnico Italiano
标准页数：16
标准简介
2ED 2017 [01/10/2017]1ED 2004 [01/03/2004]
标准备注
Classificazione CEI 47-16 (04/2004) Supersedes CEI EN 60749. (05/2008) 1ED 2004 Edition is valid until 07-04-2020. (12/2017)
本标准替代的旧标准
等同采用的国际标准
EN 60749-4:2017 - Identical
