EIA JESD 22-A110:1999被替代
Highly Accelerated Temperature And Humidity Stress Test (hast)
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 22-A110:1999
发布时间：1999/2/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：0
标准简介
Evaluates the reliability of non-hermetic packaged solid state devices in humid environments. Employs severe conditions of temperature, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
标准备注
Supersedes EIA JESD 22 (07/2004)
本标准替代的旧标准
替代本标准的新标准
