CEI EN 60749-44 Ed. 1 (2017)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 44: Neutron Beam Irradiated Single Event Effect (See) Test Method For Semiconductor Devices
出版：Comitato Elettrotecnico Italiano
专家解读视频
基本信息
标准编号： CEI EN 60749-44 Ed. 1 (2017)
标准类别：Standard
出版单位：Comitato Elettrotecnico Italiano
标准页数：28
标准简介
1ED 2017 [01/06/2017]
标准备注
Classificazione CEI 47-139. (07/2017)
等同采用的国际标准
EN 60749-44:2016 - Identical
