91/26546 DC被替代
Amendment To Cecc 50 000 (issue 4) Generic Specification: Discrete Semiconductor Devices - Addition Of Subclause 4.3.5 `test Methods For Discrete Semiconductor Devices Sensitive To Electrostatic Discharge (esd) Voltage Pulses Of Short Duration' (cecc(secretariat)2759)
出版：British Standards Institution
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