I.S. EN 60749-38:2008现行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 38: Soft Error Test Method for Semiconductor Devices With Memory
出版：National Standards Authority of Ireland
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基本信息
标准编号： I.S. EN 60749-38:2008
发布时间：2010/1/12 0:00:00
标准类别：Standard
出版单位：National Standards Authority of Ireland
标准页数：16
标准简介
Describes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation.
等同采用的国际标准
EN 60749-38:2008 - Identical
