IEC 61163-1 Ed. 2.0现行
Reliability stress screening Part 1: Repairable assemblies manufactured in lots
出版：International Electrotechnical Committee
专家解读视频
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
UNE 200004-1:2002 - Identical
NEN 11163-1:1995 - Identical
NEN IEC 61163-1:1995 - Identical
PN EN 61163-1:2008 - Identical
NEN EN IEC 61163-1:2007 - Identical
CEI EN 61163-1 Ed. 2 (2007) - Identical
BS EN 61163-1:2006 - Identical
DIN EN 61163-1 (2007-06) - Identical
NF EN 61163-1:2007 - Identical
I.S. EN 61163-1:2006 - Identical
OVE/ONORM EN 61163-1:2007 - Identical
SS EN 61163-1 Ed. 1 (2007) - Identical
