DIN 51096 (2008-07)被替代
Testing Of Ceramic Raw And Basic Materials - Direct Determination Of Mass Fractions Of Impurities In Powders And Granules Of Silicon Carbide By Inductively Coupled Plasma Optical Emission Spectrometry (icp Oes) And Electrothermal Vaporisation (etv)
出版：German Institute for Standardisation (Deutsches Institut für Normung)
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