EIA JESD 354:1968 (R2009)现行
The Measurement Of Transistor Equivalent Noise Voltage And Equivalent Noise Current At Frequencies Of Up To 20 Khz
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 354:1968 (R2009)
发布时间：2009/3/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：14
标准简介
Provides a method for determining values, for device registration purposes, for transistor equivalent noise voltage and equivalent noise current at frequencies up to 20 kHz. This method is applicable to transistors whose noise has a Gaussian, flat (white) or l/f power distribution.
标准备注
Renamed from EIA 354. (07/2010)
本标准替代的旧标准
