IEC 60749-36 : 1.0现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE
出版：International Electrotechnical Committee
专家解读视频
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
PN EN 60749-36 : 2005 - Identical
CEI EN 60749-36 : 2004 - Identical
BS EN 60749-36 : 2003 - Identical
DIN EN 60749-36 : 2003 - Identical
I.S. EN 60749-36:2003 - Identical
NEN EN IEC 60749-36 : 2003 - Identical
DS EN 60749-36 : 2003 - Identical
