ISO 25498:2018现行
Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
出版：International Organization for Standardization
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基本信息
标准编号： ISO 25498:2018
发布时间：2018/3/16 0:00:00
标准类别：Standard
出版单位：International Organization for Standardization
标准页数：38
标准简介
Describes the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens.
等同采用的国际标准
BS ISO 25498 : 2010 - Identical
