IEC 62951-1 Ed. 1.0现行
Semiconductor devices - Flexible and stretchable semiconductor devices Part 1: Bending test method for conductive thin films on flexible substrates
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 62951-1 Ed. 1.0
发布时间：2017/4/10 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：20
标准简介
Describes a bending test method to measure the electromechanical properties or flexibility of conductive thin films deposited or bonded on flexible non-conductive substrates.
