
Reliability growth - Stress testing for early failures in unique complex systems
出版:International Electrotechnical Committee

专家解读视频
This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests.
NEN EN IEC 62429:2008 - Identical
OVE/ONORM EN 62429:2008 - Identical
PN EN 62429:2008 - Identical
DIN EN 62429 (2008-08) - Identical
NF EN 62429:2008 - Identical
I.S. EN 62429:2008 - Identical
BS EN 62429:2008 - Identical
NF EN 62429:2006 - Identical