
Semiconductor devices. Generic specification for discrete devices and integrated circuits
出版:British Standards Institution

专家解读视频
General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.
© British Standards Institution 2013
Replaces notes:
Replaces BS 9450:1998 which remains current and BS 9970:Part 0:1985 which is withdrawn.
Amendment notes:
AMD 9348 published 15 February 1997
Corrigendum, July 2011
Document identifier notes:
Formerly BS QC 700000:1991.
IEC 60747-10 Ed. 2.0 - Identical