IEC 61163-1 : 2.0现行
RELIABILITY STRESS SCREENING - PART 1: REPAIRABLE ASSEMBLIES MANUFACTURED IN LOTS
出版：International Electrotechnical Committee
专家解读视频
Specifies particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
NEN IEC 61163-1 : 95 C1 2000 - Identical
UNE EN 61163-1 : 2010 - Identical
BIS IS 15444-1 : 2012(R2016) - Identical
DS EN 61163-1 : 2007 - Identical
CEI EN 61163-1 : 2007 - Identical
I.S. EN 61163-1:2006 - Identical
NEN EN IEC 61163-1 : 2007 - Identical
UNE 200004-1 : 2002 - Identical
CEI 56-35 : 1ED 2000 - Identical
BS EN 61163-1 : 2006 - Identical
NEN 11163-1 : 1995 - Identical
PN EN 61163-1 : 2008 - Identical
DIN EN 61163-1 : 2007 - Identical
