CEI EN 60749-44 : 1ED 2017现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
出版：Comitato Elettrotecnico Italiano
专家解读视频
基本信息
标准编号： CEI EN 60749-44 : 1ED 2017
标准类别：Standard
出版单位：Comitato Elettrotecnico Italiano
标准页数：0
标准简介
Sets up a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.
