
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 9: Permanence Of Marking
出版:Danish Standards

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基本信息
标准编号: DS EN 60749-9:2002
发布时间:2003/1/8 0:00:00
标准类别:Standard
出版单位:Danish Standards
标准页数:16
标准简介
Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
替代本标准的新标准