EIA JESD 340:1967 (R2009)现行
Standard For The Measurement Of Cre
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 340:1967 (R2009)
发布时间：2009/3/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：18
标准简介
Provides an easily measured parameter which is one of the main characteristics in determining the stability of a transistor intended for small-signal operation. The measurement allows for rapid testing. Its correlation to ac stability will help establish the interchangeability of a device.
标准备注
Renamed from EIA 340. (07/2010)
本标准替代的旧标准
