BS 9300:1969被替代
Specification for semiconductor devices of assessed quality: generic data and methods of test
出版：British Standards Institution
专家解读视频
Forms part of the system of standards for electronic components of assessed quality. Terms, definitions, test methods and other material necessary to implement fully the detail specifications for semiconductor devices. Included in section 2 are the general rules for preparation of detail specifications. Appendix C gives the agreed procedure for the adoption of specifications in the CV7000 series into the BS 9000 system. See also PD 6460.
© British Standards Institution 2013
Replaces notes:
Replaces BS 3494:Part 1:1967 and BS 3494:Part 2:1966.
Amendment notes:
AMD 2132 published 15 October 1976
AMD 2589 published 15 July 1978
AMD 3091 published 15 April 1980
AMD 3557 published 15 August 1981
AMD 3978 published 15 August 1982
AMD 4589 published 15 September 1984
AMD 670 published 15 December 1970
AMD 682 published 15 February 1971
AMD 7517 published 15 February 1993
AMD 855 published 15 February 1972
