ISO 20263:2017现行
Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials
出版：International Organization for Standardization
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基本信息
标准编号： ISO 20263:2017
发布时间：2017/12/1 0:00:00
标准类别：Standard
出版单位：International Organization for Standardization
标准页数：45
标准简介
Describes a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials
本标准替代的旧标准
