NEN-EN-IEC 60749-17:2019现行
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
出版：Netherlands Standards
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基本信息
标准编号： NEN-EN-IEC 60749-17:2019
标准类别：Standard
出版单位：Netherlands Standards
标准页数：0
标准简介
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation.
本标准替代的旧标准
等同采用的国际标准
EN IEC 60749-17:2019 - Identical
IEC 60749-17:2019 - Identical
IEC 60749-17:2019 - Identical
EN IEC 60749-17:2019 - Identical
