IEC 60749-6 : 2.0现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE
出版：International Electrotechnical Committee
专家解读视频
The purpose of this part of IEC 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
EN 60749-6 : 2017 - Identical
CEI EN 60749-6 : 2004 - Identical
NEN EN IEC 60749-6 : 2017 - Identical
BS EN 60749-6 : 2017 - Identical
CEI EN 60749-6 : 2004 - Identical
DS EN 60749-6 : 2017 - Identical
NBR IEC 60749-6 : 2011 - Identical
PN EN 60749-6 : 2017 - Identical
BS EN 60749-6 : 2002 - Identical
DS EN 60749-6 : 2017 - Identical
NEN EN IEC 60749-6 : 2017 - Identical
PN EN 60749-6 : 2017 - Identical
