IEC 60747-10 Ed. 2.0废止

It is a generic specification for semiconductor devices, discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for measuring methods of electrical characteristics, climatic and mechanical tests, and endurance tests.

SS IEC 747 Ed. 2 (1993) - Identical

UTEC 96 010:1989 - Identical

PN 92/T-01103:1992 - Identical

BS IEC 60747-10:1991 - Equivalent

DIN IEC 60747-10 (1987-10) - Identical

NEN 10747-10:1997 - Identical

BS 9970-0:1985 - Identical

IEC 60747-10 Amd.3 Ed. 2.0 -