IEC PAS 62205 : 1.0被替代
HIGH TEMPERATURE STORAGE LIFE
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC PAS 62205 : 1.0
发布时间：2000/11/28 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：10
标准简介
Aims to determine the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive and therefore, is applicable for device qualification.
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