IEC 61641 : 1.0被替代
ENCLOSED LOW-VOLTAGE SWITCHGEAR AND CONTROLGEAR ASSEMBLIES - GUIDE FOR TESTING UNDER CONDITIONS OF ARCING DUE TO INTERNAL FAULT
出版：International Electrotechnical Committee
专家解读视频
Takes into consideration the thermal effects of the arc or its roots on the enclosures and of ejected hot gases and glowing particles, but not damage to internal partitions.
CEI 17-86 : 2008 - Identical
NEN NPR 11641 : 1996 - Identical
DIN EN 60439-1 SUPP 2 : 2009 - Identical
SAC GB/Z 18859 : 2002 - Identical
VDE 0660-500 SUPP 2 : 2009 - Identical
UNE 201001 : 2000 - Identical
PN E-05163 : 2002 - Identical
UNE 201001 : 2000 - Identical
PN E-05163 : 2002 - Identical
NEN NPR 11641 : 1996 - Identical
SAC GB/Z 18859 : 2002 - Identical
