EIA JEP 172:2014被替代
Discontinuing Use Of The Machine Model For Device Esd Qualification
出版：Joint Electronics Device Engineering Council (JEDEC)
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基本信息
标准编号： EIA JEP 172:2014
发布时间：2014/7/1 0:00:00
标准类别：Standard
出版单位：Joint Electronics Device Engineering Council (JEDEC)
标准页数：20
标准简介
Demonstrates evidence to discontinue use of "machine model" particular model stress test without incurring any reduction in the IC component's ESD reliability for manufacturing. Aims to provide the necessary technical arguments for strongly recommending no further use of this model for IC qualification.
替代本标准的新标准
