I.S. EN 60749-3:2017现行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 3: External Visual Examination
出版：National Standards Authority of Ireland
专家解读视频
Defines the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
EN 60749-3:2017 - Identical
EN 60749-3 : 2017 - Identical
DIN EN 60749-3 : 2003 - Identical
UNE EN 60749-3 : 2003 - Identical
NBN EN 60749-3 : 2003 - Identical
NF EN 60749-3 : 2002 - Identical
BS EN 60749-3 : 2002 - Identical
BS EN 60749-3 : 2017 - Identical
DIN EN 60749-3 : 2003 - Identical
BS EN 60749-3:2017 - Identical
