IEEE 1149.1:2001 (R2008)被替代
Test Access Port and Boundary-scan Architecture
出版：Institute of Electrical and Electronics Engineers
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基本信息
标准编号： IEEE 1149.1:2001 (R2008)
标准类别：Standard
出版单位：Institute of Electrical and Electronics Engineers
标准页数：208
标准简介
Gives a definition of test logic which can be included as an integrated circuit to provide standardized approaches to testing interconnections between integrated circuits when assembled onto a printed circuit, testing the integrated circuit itself, and observing or modifying circuit activity during the component's normal operation. Coverage includes test logic architecture, the instruction register, test data registers, the bypass register, and the device identification register.
标准备注
Supersedes IEEE 1149.1B (09/2001) Supersedes IEEE DRAFT 1149.1 (02/2005)
替代本标准的新标准
