DRAFT STANDARD TEST ACCESS PORT AND BOUNDARY-SCAN ARCHITECTURE
出版:Institute of Electrical & Electronics Engineers
专家解读视频
Gives a general overview of the operation of a component compatible with this standard and provides a background to the detailed discussion in later clauses.
IEEE 1149.1 : 2013
提交获取原文申请后24小时内系统会通过站内消息将原文链接发至您的用户中心。
您可以扫描关注“寰标网微信服务平台”,系统会第一时间给您通知。
关注“寰标网”微信公众号服务