IEC 61189-5-503 Ed. 1.0现行
Test methods for electrical materials, printed board and other interconnection structures and assemblies Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 61189-5-503 Ed. 1.0
发布时间：2017/5/22 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：28
标准简介
Describes the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).
