ISO 19668:2017现行
Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials
出版：International Organization for Standardization
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基本信息
标准编号： ISO 19668:2017
发布时间：2017/8/14 0:00:00
标准类别：Standard
出版单位：International Organization for Standardization
标准页数：24
标准简介
Defines a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported.
