
The Measurement Of Transistor Noise Figure At Frequencies Up To 20 Khz By Sinusoidal Signal-generator Method
出版:JEDEC Solid State Technology Association

专家解读视频
基本信息
标准编号: EIA 353:1968 (R1999)
标准类别:Standard
出版单位:JEDEC Solid State Technology Association
标准页数:0
标准简介
This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors which noise has a l/f (power inversely proportional to frequency) power distribution.
替代本标准的新标准