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IEC 60068-2-20 Ed. 5.0现行

Environmental testing Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads

出版:International Electrotechnical Committee

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基本信息
标准编号: IEC 60068-2-20 Ed. 5.0
发布时间:2008/7/21 0:00:00
标准类别:Standard
出版单位:International Electrotechnical Committee
标准页数:20
标准简介

IEC 60068-2-20:2008 outlines Test T, applicable to devices with leads. Soldering tests for surface mounting devices (SMD) are described in IEC 60068-2-58. This standard provides procedures for determining the solderability and resistance to soldering heat of devices in applications using solder alloys, which are eutectic or near eutectic tin lead (Pb), or lead-free alloys. The procedures in this standard include the solder bath method and soldering iron method. The objective of this standard is to ensure that component lead or termination solderability meets the applicable solder joint requirements of IEC 61191-3 and IEC 61191-4. In addition, test methods are provided to ensure that the component body can resist against the heat load to which it is exposed during soldering. The major technical changes with regard to the fourth edition are the following: - the solder globule test is deleted; - test conditions and requirements for lead-free solders are added.

本标准替代的旧标准

IEC 60068-2-20 Ed. 4.0

等同采用的国际标准

I.S. EN 60068-2-20:2008 - Identical

NEN EN IEC 60068-2-20:2008 - Identical

PN EN 60068-2-20:2008 - Identical

BS EN 60068-2-20:2008 - Identical