NBN EN ISO 12179 Ed. 1 (2000)现行

Applicable to the calibration of the metrological characteristics of contact (stylus) instruments for measuring surface texture using the profile procedure as specified in ISO 3274.

I.S. EN ISO 12179:2000 - Identical

SN EN ISO 12179:2000 - Identical

BS EN ISO 12179:2001 - Identical

DIN EN ISO 12179 (2000-11) - Identical

ONORM EN ISO 12179:2000 - Identical

NF EN ISO 12179:2000 - Identical

UNI EN ISO 12179:2001 - Identical

NS EN ISO 12179:2000 - Identical

UNE EN ISO 12179:2001 - Identical

SS EN ISO 12179 Ed. 1 (2000) - Identical

ISO 12179:2000 - Identical

NEN EN ISO 12179:2000 - Identical

ONORM EN ISO 12179:2009 - Identical