91/26544 DC : DRAFT JUN 1991被替代
AMENDMENT TO CECC 50 000 (ISSUE 4) GENERIC SPECIFICATION: DISCRETE SEMICONDUCTOR DEVICES - ADDITION OF SUBCLAUSE 4.3.5 "TEST METHODS FOR MICROWAVE DEVICES" (CECC (SECRETARIAT) 2760, 2761, 2762, 2763, 2764 AND 2765)
出版：British Standards Institution
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