专家解读视频
Specifies profiles and general structure of contact instruments for measurement of surface roughness and waviness, enabling existing international standards to be applied to practical profile evaluating. Defines properties of the instrument which influence profile evaluation and gives basics of the specification of contact instruments (profile meter and profile recorder).
SN EN ISO 3274:1998 - Identical
NEN EN ISO 3274:1997 - Identical
DIN EN ISO 3274 (1998-04) - Identical
ONORM EN ISO 3274:1998 - Identical
I.S. EN ISO 3274:1998 - Identical
NF EN ISO 3274:1998 - Identical
BS EN ISO 3274:1998 - Identical
UNE EN ISO 3274:1998 - Identical
UNI EN ISO 3274:1998 - Identical
NS EN ISO 3274 Ed. 1 (1998) - Identical
SS EN ISO 3274 Ed. 1 (1998) - Identical
ISO 3274:1996 - Identical
