ASTM F1192-00(2006)被替代
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
出版：American Society for Testing and Materials
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基本信息
标准编号： ASTM F1192-00(2006)
发布时间：2006/7/1 0:00:00
标准类别：Standard
出版单位：American Society for Testing and Materials
标准页数：11
标准简介
CONTAINED IN VOL. 10.04, 2006Gives the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an atomic number Z => 2.
本标准替代的旧标准
替代本标准的新标准
