ISO/DIS 25498 : 60.00 (2018)被替代
MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE
出版：International Organization for Standardization
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基本信息
标准编号： ISO/DIS 25498 : 60.00 (2018)
标准类别：Standard
出版单位：International Organization for Standardization
标准页数：0
标准简介
Defines the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens.
替代本标准的新标准
等同采用的国际标准
17/30343628 DC : 0 - Identical
