IEC 60747-5-3 : 1.1被替代
DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS
出版：International Electrotechnical Committee
专家解读视频
Defines the measuring methods that applies to the optoelectronic devices, which are not intended to be used in the fibre optic systems or subsystems.
DS EN 60747-5-3 : 2002 AMD 1 2002 - Identical
NEN IEC 60747-5-3 : 1998 - Identical
I.S. EN 60747-5-3:2001 - Identical
VDE 0884-3 : 2003 - Identical
BS IEC 60747-5.3 : 97 AMD 13434 - Identical
BS EN 60747-5-3 : 2001 - Identical
NEN EN IEC 60747-5-3 : 2001 AMD 1 2002 - Identical
PN EN 60747-5-3 : 2008 - Identical
