IEC TS 61967-3 : 2.0现行
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 3: MEASUREMENT OF RADIATED EMISSIONS - SURFACE SCAN METHOD
出版：International Electrotechnical Committee
专家解读视频
Gives a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC).
VDE V 0847-21-3 : 2015 - Identical
DIN IEC/TS 61967-3 : 2015 - Identical
NEN NPR IEC/TS 61967-3 : 2005 - Identical
BS PD IEC TS 61967-3 : 2014 - Identical
VDE V 0847-21-3 : 2015 - Identical
BS PD IEC TS 61967-3 : 2014 - Identical
DIN IEC/TS 61967-3 : 2015 - Identical
